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001-es BibID:	BIBFORM058822
Első szerző:	Lovics Riku (fizikus)
Cím:	SNMS depth profile analysis of solar cells using conducting mesh / R. Lovics, A. Csik, V. Takáts, K. Vad, G.A. Langer
Dátum:	2010
Megjegyzések:	A new and promising approach for photovoltaic application of microcrystalline silicon (?-Si) is the so-called "micromorph tandem" structure, which is a serial combination of an amorphous and a microcrystalline cell. The development and implementation of that technology into industrial manufacturing line may result in the reduction of specific processing costs and increasing efficiency. On the other hand, not only the production, but the analysis of the produced layers is also important in order to improve the technology efficiency. One of the most effective used technique for the dept profile analysis of these samples is the Secondary Neutral Mass Spectrometry (SNMS). However, in the case of insulating samples the surface charge can be a serious problem during depth profile analysis. Beside of the earlier developed high frequency mode (HFM) of electron-gas SNMS there is another method to prevent the charge accumulation. By using a conducting mesh (e.g. copper, stainless steel) placed on the sample surface, we have an opportunity to neutralize the surface charge during measurements.
Tárgyszavak:	Természettudományok Fizikai tudományok poszter
Megjelenés:	13th Joint Vacuum Conference June 20-24, 2010, Štrbské Pleso. - (2010), p. 15.
További szerzők:	Csik Attila (1975-) (fizikus) Takáts Viktor Vad Kálmán Langer Gábor Antal (1950-) (fizikus)
Internet cím:	Intézményi repozitóriumban (DEA) tárolt változat
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