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001-es BibID:BIBFORM008864
Első szerző:Girardeaux, Christophe
Cím:How to measure accurately mass transport in thin films by AES / C. Girardeaux, G. Clugnet, Z. Erdélyi, J. Nyéki, J. Bernardini, D. Beke, A. Rolland
Dátum:2002
ISSN:0142-2421
Megjegyzések:In this paper, we show that AES is a powerful technique to determine mass transport in thin films with model metal/metal thin-layer structures (for systems without any compound formation). We show the conditions where grain boundary and/or bulk diffusion coefficients can be determined accurately at unusually low temperatures by monitoring the surface segregation kinetics of an impurity through a nanocrystalline film using the Hwang-Balluffi approach (systems with total solubility), and the dissolution of ultrathin deposits in a matrix using a model based on Martin's kinetic deterministic equations (systems with total solubility). Copyright (C) 2002 John Wiley Sons, Ltd.
Tárgyszavak:Természettudományok Fizikai tudományok idegen nyelvű folyóiratközlemény külföldi lapban
Megjelenés:Surface and interface analysis. - 34 : 1 (2002), p. 389-392. -
További szerzők:Clugnet, G. Erdélyi Zoltán (1974-) (fizikus) Nyéki József (fizikus) Bernardini, Jean Beke Dezső László (1945-) (fizikus) Rolland, Andrée
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2.

001-es BibID:BIBFORM008805
Első szerző:Kövér László (fizikus)
Cím:Determination of overlayer thickness by QUASES analysis of photon-excited KLL Auger spectra of Ni and Cu films / L. Kövér, S. Tougaard, J. Tóth, L. Daróczi, I. Szabó, G. Langer, M. Menyhárd
Dátum:2001
ISSN:0142-2421
Megjegyzések:Quantitative characterization of overlayer nanostructures is important for many practical applications and has become a feasible task for electron spectroscopy. The QUASES (Quantitative Analysis of Surfaces by Electron Spectroscopy) software package, developed recently, provides a general tool for quantification in XPS by analysing the spectral shape of the background caused by inelastic scattering of the signal electrons and has been applied successfully for determining the thickness of surface films in the nanometre range. In this work the application of such analysis is extended to metallic films having several tens of nanometre thickness and the accuracy of the results is tested by using independent methods. Both Ni and Cu KLL Auger spectra were photoexcited from Ni and Cu overlayers (deposited onto Si substrates) of different thicknesses in the 10-60 nm range, and were measured with high energy resolution. The film thickness values from the QUASES spectral shape analysis are compared with the data obtained by using a quartz crystal microbalance, cross-sectional transmission electron microscopy and scanning probe microscopy (SPM). Good consistency has been found for the thickness values obtained from the spectral shape analysis and from microscopy, especially for Ni films. Assuming nominal film thickness, the values of the inelastic mean free path of 6-7 keV energy electrons in Ni and Cu were also determined, showing good (Ni) or reasonable (Cu) agreement with those proposed by Powell and Jablonski. The effect of island formation was shown by the QUASES spectral shape analysis and confirmed by SPM, Copyright (C) 2001 John Wiley & Sons, Ltd.
Tárgyszavak:Természettudományok Fizikai tudományok idegen nyelvű folyóiratközlemény külföldi lapban
Megjelenés:Surface and interface analysis. - 31 : 4 (2001), p. 271-279. -
További szerzők:Tougaard, S. Tóth József (fizikus) Daróczi Lajos (1965-) (fizikus) Szabó István András (1956-) (fizikus) Langer Gábor Antal (1950-) (fizikus) Menyhárd Miklós
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3.

001-es BibID:BIBFORM008885
Első szerző:Tóth József (fizikus)
Cím:XPS and EPMA Study of Size-fractioned Ambient Aerosol Particles Collected in Urban Industrial Areas / Toth J., Beszeda I., Cserhati C., Medve, F.
Dátum:1997
ISSN:0142-2421
Tárgyszavak:Természettudományok Fizikai tudományok idegen nyelvű folyóiratközlemény külföldi lapban
Megjelenés:Surface and interface analysis. - 25 : 13 (1997), p. 970-982. -
További szerzők:Beszeda Imre (1966-) (okl. anyagtudományi mérnök-fizikus) Cserháti Csaba (1963-) (fizikus) Medve Ferenc
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